X-Ray Reflectivity measurements to evaluate thin films and multilayers thickness: preliminary results of the first world Round-Robin Test
| Authors | |
|---|---|
| Year of publication | 2006 |
| Type | Article in Proceedings |
| Conference | XTOP 2006 - 8th Biennial Conference on High Resolution X-Ray Diffraction and Imaging |
| MU Faculty or unit | |
| Citation | |
| Field | Solid matter physics and magnetism |
| Keywords | standartization; x-ray reflectivity |
| Description | A round-robin involving 20 laboratories was started in September 2005 to assess the reproducibility of the spectra and errors in the calculated sample thickness of several specimens of GaAs/GaAl multilayers. Preliminary results were presented and discussed. |
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