Structural characterization of self-assembled Ge dot multilayers by x-ray diffraction and reflectivity methods

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Authors

DARHUBER A.A. HOLÝ Václav SCHITTENHELM P. STANGL J. KEGEL I. KOVATS Z. METZGER T.H. BAUER G. ABSTREITER G. GRUEBEL G.

Year of publication 1998
Type Article in Periodical
Magazine / Source Physica E 2
MU Faculty or unit

Faculty of Science

Citation
Field Solid matter physics and magnetism
Keywords multilayers by x-ray
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