Structural characterization of self-assembled Ge dot multilayers by x-ray diffraction and reflectivity methods

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Authors	DARHUBER A.A. HOLÝ Václav SCHITTENHELM P. STANGL J. KEGEL I. KOVATS Z. METZGER T.H. BAUER G. ABSTREITER G. GRUEBEL G.
Year of publication	1998
Type	Article in Periodical
Magazine / Source	Physica E 2
MU Faculty or unit	Faculty of Science
Citation
Field	Solid matter physics and magnetism
Keywords	multilayers by x-ray
Related projects:	Physical properties of new materials and layered structures