Independent analysis of mechanical data from atomic force microscopy

Investor logo
Investor logo

Warning

This publication doesn't include Faculty of Sports Studies. It includes Central European Institute of Technology. Official publication website can be found on muni.cz.
Authors

KLAPETEK Petr NEČAS David

Year of publication 2014
Type Article in Periodical
Magazine / Source Measurement Science and Technology
MU Faculty or unit

Central European Institute of Technology

Citation
Web Vydavatel
Doi http://dx.doi.org/10.1088/0957-0233/25/4/044009
Field Sensors, measuring and regulation
Keywords atomic force microscopy; mechanical properties; volume data
Attached files
Description Present atomic force microscopes are capable of acquiring large data volumes by point using point force-distance spectroscopic measurements. Even if different trade names and different technical implementations are used, for most of these techniques a force-distance curve in every image pixel is measured, this curve is immediately fitted by some theoretical dependence and results are displayed as a mechanical properties channel (Young modulus, adhesion, etc). Results are processed during the measurement directly in the scanning probe microscopy controller or, after it, by manufacturer provided software. In this paper, we present a software tool for independent numerical processing of such data, including more numerical models for the force–distance curve evaluation and including a simple estimate of uncertainties related to the fitting procedure. This can improve the reliability and the analytical possibilities of mechanical properties mapping methods in an atomic force microscopy.
Related projects:

You are running an old browser version. We recommend updating your browser to its latest version.

More info