Influence of substrate material on plasma in deposition/sputtering reactor: experiment and computer simulation

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Publikace nespadá pod Fakultu sportovních studií, ale pod Přírodovědeckou fakultu. Oficiální stránka publikace je na webu muni.cz.
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BRZOBOHATY O. BURŠÍKOVÁ Vilma NEČAS David VALTR Miroslav TRUNEC David

Rok publikování 2008
Druh Článek v odborném periodiku
Časopis / Zdroj Journal of physics D: Applied physics
Fakulta / Pracoviště MU

Přírodovědecká fakulta

Citace
www https://iopscience.iop.org/article/10.1088/0022-3727/41/3/035213
Doi http://dx.doi.org/10.1088/0022-3727/41/3/035213
Klíčová slova SECONDARY-ELECTRON EMISSION; PARTICLE SIMULATION; THIN-FILMS; DISCHARGES; MODEL; DEPOSITION; SURFACE; ENERGY
Popis The aim of this work was to investigate the influence of the substrate material on the plasma enhanced chemical vapour deposition and the plasma sputtering of thin films in low pressure (3-20 Pa) parallel-plate radio frequency (rf) discharges. It was observed that the deposition or sputtering rates differed above different materials, e. g. above a substrate and substrate electrode. Moreover, the substrates placed on the bottom rf electrode seemed to be mirrored in the thickness of a thin film deposited or sputtered on the upper grounded electrode. The influence of the substrate material on the plasma parameters was studied via particle in cell/Monte Carlo computer simulation. According to our finding the mirroring of the substrate was caused by different secondary electron emission yields of the substrate material and material of the substrate electrode. This difference in the secondary electron yield affected plasma density above the substrate leading to higher or lower deposition or sputtering rates on the grounded electrode. Therefore, the role of secondary electrons in the discharge was studied. Spatial distributions of impact positions on the grounded electrode for electrons and ions emitted from the rf electrode and created in the ionization avalanche of the secondary electrons were calculated in order to simulate the mirroring of the substrates.
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