Tip dilation artefacts & roughness measurement – parametric approach
| Autoři | |
|---|---|
| Rok publikování | 2019 |
| Druh | Konferenční abstrakty |
| Fakulta / Pracoviště MU | |
| Citace | |
| Popis | Morphological dilation of surface with AFM tip (tip convolution) is a more or less unavoidable effect which distorts the measured topography. Hence many reconstruction methods based on Legendre transformation or Villarrubia’s morphological algorithms were proposed and studied as well as various other corrections for specific measured geometrical shapes. In characterisation of randomly rough surfaces we are usually only interested in statistical quantities, such as mean square roughness or autocorrelation length. Therefore, a different approach can be taken. Instead of attempting to reconstruct the surface, we find the map (true roughness parameters; tip parameters) - (measured parameters) for a specific class of rough surfaces. This allows a simple and fast estimation of tip convolution influence and, to a certain degree, also correction. We explore this avenue for Gaussian surfaces, show how composite parameters allow reducing the dimensionality of the problem and elucidate some interesting related phenomena, such as the increase of measured roughness with tip wear |
| Související projekty: |