Project information
Physical properties of new materials and layered structures
- Project Identification
- MSM 143100002
- Project Period
- 1/1999 - 12/2004
- Investor / Pogramme / Project type
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Ministry of Education, Youth and Sports of the CR
- Research Intents
- MU Faculty or unit
- Faculty of Science
- Keywords
- semiconductors;low-dimensional structures;quantum dots;organic layers;ferroelectrics;high-temperature superconductors;ellipsometry;reflectometry;x-ray diffraction;x-ray reflection
Results
Publications
Total number of publications: 213
1996
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Quantitative Study of Interface Roughness Replication in Multilayers Using X-ray Reflectivity and Transmission Electron Microscopy
Appl. Phys. Lett., year: 1996, volume: 69(19960, edition: 9
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Scanning-tunneling-microscopy Observation of Stress-driven Surface Diffusion Due to Localized Strain Fields of Misfit Dislocations in Heteroepitaxy
Physical Review B, year: 1996, volume: 54(1996), edition: -
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Structural characterization of reactive ion-etched semicond uctor nanostructures using x-ray reciprocal space mapping
Mat. Res. Soc. Symp. Proc., year: 1996, volume: 1996, edition: 405
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Theoretical description of multiple crystal arrangements
X-ray and neutron dynamical diffraction: theory and applications, year: 1996
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Thermal Stability of SIS Tunnel Junction with Silicon Barrier
Czechoslovak Journal of Physic, Suppl. S2, year: 1996, volume: 46(1996), edition: S2
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X-ray and neutron diffuse scattering from multilayers of fatty acid salt molecules
Physica B, year: 1996, volume: 1996, edition: 221
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X-ray reflectivity and diffuse scattering study of thermally treated XSi/Si multilayers
Mater. Sci. Forum, year: 1996, volume: 1996, edition: 228-231
1995
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Crystalline and Quasi-cristalline Patterns in X-Ray Diffraction from Periodic Arrays of Quantum Dots
Europhysics Letters, year: 1995, volume: 32(1995), edition: 2
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Determination of threading dislocation density in hetero-epitaxial layers by diffuse x-ray scattering
J. Phys. D: Appl. Phys., year: 1995, volume: 28, edition: -
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Diffuse x-ray scattering from misfit dislocations in SiGe epitaxial layers with graded Ge content
J. Appl. Phys., year: 1995, volume: 78(1995), edition: 8