Spectroscopic ellipsometry of few-layer graphene

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Authors	ISIC Goran JAKOVLJEVIC Milka FILIPOVIC Marko JOVANOVIC Djordje VASIC Borislav LAZOVIC Sasa PUAC Nevena PETROVIC Zoran KOSTIC Radmila GAJIC Rados HUMLÍČEK Josef LOSURDO Maria BRUNO Giovanni BERGMAIR Iris HINGERLT Kurt
Year of publication	2011
Type	Article in Periodical
Magazine / Source	Journal of Nanophotonics
MU Faculty or unit	Faculty of Science
Citation
Doi	http://dx.doi.org/10.1117/1.3598162
Field	Solid matter physics and magnetism
Keywords	graphene; ellipsometry; island film model
Description	The optical properties of few-layer graphene (FLG) films were measured in the ultraviolet and visible spectrum using a spectroscopic ellipsometer equipped with a 50-mu m nominal microspot size. The FLG thickness was found by atomic force microscopy. Measurements revealed that the microspot is larger than the FLG flake. The ellipsometric data was interpreted using the island-film model. Comparison with graphite and recently published graphene data showed reasonable agreement, but with some features that could not be explained. The error margin for the optical constants was estimated to be +/- 10%.
Related projects:	Physical and chemical properties of advanced materials and structures