Characterization of near field optical microscope probes

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Authors

KLAPETEK Petr VALTR Miroslav KLENOVSKÝ Petr BURŠÍK Jiří

Year of publication 2008
Type Article in Periodical
Magazine / Source Surface and Interface Analysis
MU Faculty or unit

Faculty of Science

Citation
Field Optics, masers and lasers
Keywords near field scanning optical microscopy;image artefacts;optical analysis
Description In this article the far-field radiation analysis of near-field optical probes is presented. It is shown that the quality of probes used for near-field scanning microscopy imaging can be estimated using directional measurements of the far-field radiation patterns. Experimental results are compared with numerical modeling of far-field radiation performed using finite difference in time-domain method (FDTD) and with SEM characterization of real probe geometry. The effects of probe geometry on real measurement on different samples are studied as well.
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