Application of the wavelet transformation in AFM data analysis
| Authors | |
|---|---|
| Year of publication | 2005 |
| Type | Article in Periodical |
| Magazine / Source | Acta Physica Slovaca |
| MU Faculty or unit | |
| Citation | |
| Field | Solid matter physics and magnetism |
| Keywords | AFM; Wavelet transform |
| Description | In this article the possibilities of the wavelet transform use within atomic force microscopy data processing are presented. Both discrete and continuous wavelet transform is used for different processing and analytical purposes including denoising, AFM scan error detection, background removal and multifractal analysis. It is shown that the use of wavelet transform can be very effective within AFM data analysis, namely for highly irregular data. |
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