Optical properties of NiO thin films prepared by pulsed laser deposition technique

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Authors

FRANTA Daniel NEGULESCU Beatrice THOMAS Luc DAHOO Pierre Richard GUYOT Marcel OHLÍDAL Ivan MISTRÍK Jan YAMAGUCHI Tomuo

Year of publication 2005
Type Article in Periodical
Magazine / Source Applied Surface Science
MU Faculty or unit

Faculty of Science

Citation
Web http://hydra.physics.muni.cz/~franta/bib/ASS244_426.html
Field Solid matter physics and magnetism
Keywords NiO films; Optical constants; Ellipsometry; Reflectometry
Description In this paper the optical characterization of the NiO thin films prepared by pulsed laser deposition technique onto the quartz substrate were performed using multi-sample modification of the combined optical method based on measuring and interpreting the experimental data obtained by variable angle spectroscopic ellipsometry and spectrophotometry in reflected and transmitted light. A new dispersion model of the optical constants of the NiO films was also used. This dispersion model was based on parameterizing of the joint density of states together with the Gaussian broadening. The defects consiting in boundary roughness and refractive index profile were taken into account in optical characterization of the NiO films too. The spectral dependences of the optical constants together with the parameters characterizing the defects of these films were determined.
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