X-ray diffraction on laterally modulated (InAs)n/(AlAs)m short-period superlattices

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Authors

CAHA Ondřej KŘÁPEK Vlastimil HOLÝ Václav MOSS S. LI J. NORMAN A. MASCARENHAS A. RENO J. STANGL J. MEDUŇA Mojmír

Year of publication 2004
Type Article in Periodical
Magazine / Source Journal of Applied Physics
MU Faculty or unit

Faculty of Science

Citation
Field Solid matter physics and magnetism
Keywords Lateral composition modulation; short-period superlattices; x-ray scattering
Description Lateral composition modulation in InAs/AlAs short-period superlattices was investigated by x-ray grazing-incidence diffraction and coplanar x-ray diffraction at a "normal" wavelength and at an anomalous wavelength, for which diffraction from the (200) planes does not exhibit a chemical contrast. The experimental data were compared with theoretical simulations assuming that the interfaces consist of a periodic sequence of monoatomic steps.
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