Temperature dependence of ellipsometric spectra of poly(methyl-phenylsilane)

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Authors	BONAVENTUROVÁ ZRZAVECKÁ Olga NEBOJSA Alois NAVRÁTIL Karel NEŠPŮREK Stanislav HUMLÍČEK Josef
Year of publication	2004
Type	Article in Periodical
Magazine / Source	Thin Solid Films
MU Faculty or unit	Faculty of Science
Citation
Field	Solid matter physics and magnetism
Keywords	temperature; ellipsometric spectra; poly(methyl-phenylsilane);
Description	Comprehensive study of the temperature dependence of ultraviolet-visible ellipsometric spectra of thin films of poly(methyl-phenylsilane). It was found the threshold of irreversible changes of its optical response at 373 K and furthermore the average temperature shift of the lowest excitonic band in the reversible regime.The effect of annealing below and above 373 is studied with low- a high-level of the exposure to UV light.
Related projects:	Physical properties of new materials and layered structures