New Method for the Complete Optical Analysis of Thin Films Nonuniform in Optical Parameters

Investor logo
Investor logo

Warning

This publication doesn't include Faculty of Sports Studies. It includes Faculty of Science. Official publication website can be found on muni.cz.
Authors

OHLÍDAL Miloslav OHLÍDAL Ivan KLAPETEK Petr JÁKL Miloš ČUDEK Vladimír ELIÁŠ Marek

Year of publication 2003
Type Article in Periodical
Magazine / Source Japanese Journal of Applied Physics
MU Faculty or unit

Faculty of Science

Citation
Field Solid matter physics and magnetism
Keywords films nonuniform in optical parameters; optical characterization; CN_x and SiO_y mixture films
Description In this paper, a new optical method for characterizing thin films exhibiting area nonuniformity in optical parameters is described. This method is based on interpreting the spectral dependences of the reflectance measured using the special experimental arrangement described in detail. Using this method, the distribution of both the optical parameters, i.e. the local thickness and local refractive index, describing the thin film studied can be determined along a large area of the substrate. It is shown that the method presented can be employed for determining strong nonuniformities in the optical parameters of the films studied. The method is illustrated through the optical analysis of strongly nonuniform thin films formed by a mixture of CN_x and SiO_y deposited onto silicon single-crystal substrates.
Related projects:

You are running an old browser version. We recommend updating your browser to its latest version.

More info