Aplikace mikroskopie atomové síly při analýze tenkých vrstev ZnSe a ZnTe

• Title in English: Application of Atomic Force Microscopy for Analysis of ZnSe and ZnTe Thin Films
• Authors: OHLÍDAL Ivan; KLAPETEK Petr; FRANTA Daniel
• Year of publication: 2003
• Type: Article in Periodical
• Magazine / Source: Československý časopis pro fyziku
• MU Faculty or unit: Faculty of Science
• Web: http://hydra.physics.muni.cz/~franta/bib/CCF53_97.html
• Field: Solid matter physics and magnetism
• Keywords: AFM; ZnSe; ZnTe
• Description: Semiconductor layer ..

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