Aplikace mikroskopie atomové síly při analýze tenkých vrstev ZnSe a ZnTe

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Title in English Application of Atomic Force Microscopy for Analysis of ZnSe and ZnTe Thin Films
Authors

OHLÍDAL Ivan KLAPETEK Petr FRANTA Daniel

Year of publication 2003
Type Article in Periodical
Magazine / Source Československý časopis pro fyziku
MU Faculty or unit

Faculty of Science

Citation
Web http://hydra.physics.muni.cz/~franta/bib/CCF53_97.html
Field Solid matter physics and magnetism
Keywords AFM; ZnSe; ZnTe
Description Semiconductor layer ..
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