X-ray reflectivity from self-assembled structures in Ge/Si superlattices

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Authors	MEDUŇA Mojmír HOLY V. ROCH T. BAUER G.
Year of publication	2001
Type	Article in Periodical
Magazine / Source	J. Phys.D.: Appl. Phys.
MU Faculty or unit	Faculty of Science
Citation
Field	Solid matter physics and magnetism
Description	X-ray reflectivity from self-assembled structures in Ge/Si superlattices
Related projects:	Laboratory of thin films and nanostructures Self-organization processes on the interfaces during epitaxial growth of semiconductor superlattices