Identification of polystyrene microplastics in the presence of algae Chlorella sp. by means of SIMS and XPS spectroscopy
| Authors | |
|---|---|
| Year of publication | 2025 |
| Type | Article in Proceedings |
| Conference | Proceedings SPIE 13508, 23rd Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics |
| MU Faculty or unit | |
| Citation | |
| web | https://doi.org/10.1117/12.3054227 |
| Doi | http://dx.doi.org/10.1117/12.3054227 |
| Keywords | X-ray photoelectron spectroscopy; Spectroscopy; Biological samples; Chemical analysis; Polystyrene; Chemical composition; Carbon; Mass spectrometry |
| Description | Presence of microplastics is responsible for a large part of today’s environmental pollution. At the same time, identification of the MPs in the real environmental conditions (such as presence of organic material, namely algae, in water) is still highly challenging. In this contribution, we demonstrate the application of ToF SIMS and XPS spectroscopy methods for evaluation of the presence of polystyrene microplastics in the absence and in the presence of algae Chlorella sp. |
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