Optical properties of thin films of poly(methyl-phenylsilylene)

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Authors

NAVRÁTIL Karel ŠIK Jan HUMLÍČEK Josef NEŠPŮREK S.

Year of publication 1999
Type Article in Periodical
Magazine / Source Optical Materials
MU Faculty or unit

Faculty of Science

Citation
Field Solid matter physics and magnetism
Description We report the results of optical studies of thin films of poly(methyl-phenylsilylene) prepared on single-crystalline silicon and fused quartz substrates using the casting and spin coating technology. From near-normal incidence reflectance, we have determined the spectral dependence of the complex dielectric function and the complex refractive index in the energy interval from 1 to 7 eV.
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