Optical characterization of multilayer systems with randomly rough boundaries

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Authors

OHLÍDAL Ivan VIŽĎA František OHLÍDAL Miloslav

Year of publication 1999
Type Article in Proceedings
Conference 18th Congress of the International Commision for Optics: Optics for the Next Millennium
MU Faculty or unit

Faculty of Science

Citation
Field Solid matter physics and magnetism
Keywords multilayer systems; rough boundaries; coherent reflectance; optical characterization
Description In this contribution examples of the optical characterization of multilayer systems with randomly rough boundaries are presented. The method based on measuring and interpreting the spectral dependences of the coherent reflectance is used to determine the values of the optical and statistical parameters of sample of three-layer and thirteen-layer systems exhibiting the rough boundaries. The systems mentioned are formed by thin films of SiO2 and TiO2.
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