Optical characterization of multilayer systems with randomly rough boundaries

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Authors	OHLÍDAL Ivan VIŽĎA František OHLÍDAL Miloslav
Year of publication	1999
Type	Article in Proceedings
Conference	18th Congress of the International Commision for Optics: Optics for the Next Millennium
MU Faculty or unit	Faculty of Science
Citation
Field	Solid matter physics and magnetism
Keywords	multilayer systems; rough boundaries; coherent reflectance; optical characterization
Description	In this contribution examples of the optical characterization of multilayer systems with randomly rough boundaries are presented. The method based on measuring and interpreting the spectral dependences of the coherent reflectance is used to determine the values of the optical and statistical parameters of sample of three-layer and thirteen-layer systems exhibiting the rough boundaries. The systems mentioned are formed by thin films of SiO2 and TiO2.
Related projects:	Characterization of multilayer systems with randomly rough boundaries by means of optical and X - ray methods