Ellipsometric parameters and reflectances of thin films with slightly rough boundaries

Warning

This publication doesn't include Faculty of Sports Studies. It includes Faculty of Science. Official publication website can be found on muni.cz.

Authors	FRANTA Daniel OHLÍDAL Ivan
Year of publication	1998
Type	Article in Periodical
Magazine / Source	Journal of modern optics
MU Faculty or unit	Faculty of Science
Citation
Web	http://hydra.physics.muni.cz/~franta/bib/JMO45_903.html
Field	Optics, masers and lasers
Description	In this theoretical paper formulae for important optical quantities of single layers with slightly randomly rough boundaries are derived by means of a generalized Rayleigh-Rice theory. Thus the formulae for the specular reflectances, ellipsometric parameters and flux of scattered energy of the layers mentioned are presented. The theoretical results are illustrated by a numerical analysis. Practical features implied by this analysis to be relevant from the experimental point of view are introduced as well.
Related projects:	Characterization of multilayer systems with randomly rough boundaries by means of optical and X - ray methods