Statistical properties of the near-field speckle patterns of thin films with slightly rough boundaries
| Authors | |
|---|---|
| Year of publication | 1998 |
| Type | Article in Periodical |
| Magazine / Source | Optics Communications |
| MU Faculty or unit | |
| Citation | |
| Web | http://hydra.physics.muni.cz/~franta/bib/OC147_349.html |
| Field | Optics, masers and lasers |
| Keywords | Near-field optics; Speckle effect; Rough thin films |
| Description | In this theoretical paper the basic statistical quantities of the light intensity above thin-film systems with randomly rough boundaries are studied in the near-field. This means that formulae for the mean intensity, standard deviation of the intensity, correlation function of the intensity and the speckle contrast are derived for the systems mentioned in the near-field. It is assumed that the boundaries of the systems are slightly rough, i.e. that the rms values of heights of the irregularities of the boundaries are much smaller than the wavelength of incident light. The Rayleigh-Rice approach is employed for deriving the formulae expressing the quantities specified. In conclusion a brief numerical analysis of the theoretical results is presented. |
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