Interface study of W-Si/Si and obliquely deposided W/Si multilayers by grazing-incidence high-resolution x-ray diffraction

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Authors

JERGEL M. HOLÝ Václav

Year of publication 1995
Type Article in Periodical
Magazine / Source J. Phys. D: Appl. Phys.
MU Faculty or unit

Faculty of Science

Citation
Field Solid matter physics and magnetism
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