Structural and Mechanical Properties of Nanostructured C-Ag Thin Films Synthesized by Thermionic Vacuum Arc Method
Authors | |
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Year of publication | 2018 |
Type | Article in Periodical |
Magazine / Source | Journal of Nanomaterials |
MU Faculty or unit | |
Citation | |
Doi | http://dx.doi.org/10.1155/2018/9632041 |
Keywords | mechanical properties; TVA; C-Ag thin films |
Description | Nanostructured C-Ag thin films of 200nm thickness were successfully synthesized by theThermionic Vacuum Arc (TVA) method. The influence of different substrates (glass, silicon wafers, and stainless steel) on the microstructure, morphology, and mechanical properties of nanostructured C-Ag thin films was characterized byHigh-Resolution Transmission ElectronMicroscopy (HRTEM), Scanning Electron Microscopy (SEM), Atomic Force Microscopy (AFM), and TI 950 (Hysitron) nanoindenter equipped with Berkovich indenter, respectively |
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