Influence of C-60 co-deposition on the growth kinetics of diindenoperylene-From rapid roughening to layer-by-layer growth in blended organic films

Warning

This publication doesn't include Faculty of Sports Studies. It includes Faculty of Science. Official publication website can be found on muni.cz.
Authors

LORCH C. NOVÁK Jiří BANERJEE R. WEIMER S. DIETERLE J. FRANK C. HINDERHOFER A. GERLACH A. CARLA F. SCHREIBER F.

Year of publication 2017
Type Article in Periodical
Magazine / Source Journal of Chemical Physics
MU Faculty or unit

Faculty of Science

Citation
Web Full Text
Doi http://dx.doi.org/10.1063/1.4966583
Field Solid matter physics and magnetism
Keywords thin film growth; organic semiconductors; crystallinity; temperature dependence; blends; mixing; diindenoperylene; buckminsterfullerene; x-ray scattering
Description We investigated the growth of the two phase-separating materials diindenoperylene (DIP) and buckminsterfullerene C-60 with different mixing ratio in real-time and in situ by X-ray scattering experiments. We found that at room temperature, mixtures with an excess of DIP show a growth mode which is very close to the perfect layer-by-layer limit with DIP crystallites forming over the entire film thickness. An unexpected increase in the island size is observed for these mixtures as a function of film thickness. On the other hand, equimolar and C-60 dominated mixtures grow with poor crystallinity but form very smooth films. Additionally, it is observed that higher substrate temperatures lead to an increase in the length scale of phase separation with film thickness.
Related projects:

You are running an old browser version. We recommend updating your browser to its latest version.

More info