Comparison of optical models and signals from XPS and VASE characterized titanium after PBS immersion
| Authors | |
|---|---|
| Year of publication | 2012 |
| Type | Article in Periodical |
| Magazine / Source | Optics Communications |
| MU Faculty or unit | |
| Citation | |
| Doi | http://dx.doi.org/10.1016/j.optcom.2011.11.080 |
| Field | ORL, ophthalmology, stomatology |
| Keywords | Permittivity; XPS titanium; Diffractive optical element-based sensor |
| Description | A reflection models from a XPS characterized titanium surface were calculated using Bruggemans model. These models were tested in a diffractive optical element-based sensor measurements, while the samples were immersed in a phosphate buffered saline solution. A second reflectance model of a material thickness on a titanium surface was conducted, to further evaluate the reflectance information gathered with diffractive optical element-based sensor. |
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