Comparison of optical models and signals from XPS and VASE characterized titanium after PBS immersion

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Authors

PENTTINEN Niko HASOŇ Stanislav SILVENNOINEN Martti JOSKA Luděk SILVENNOINEN Raimo

Year of publication 2012
Type Article in Periodical
Magazine / Source Optics Communications
MU Faculty or unit

Faculty of Medicine

Citation
Doi http://dx.doi.org/10.1016/j.optcom.2011.11.080
Field ORL, ophthalmology, stomatology
Keywords Permittivity; XPS titanium; Diffractive optical element-based sensor
Description A reflection models from a XPS characterized titanium surface were calculated using Bruggemans model. These models were tested in a diffractive optical element-based sensor measurements, while the samples were immersed in a phosphate buffered saline solution. A second reflectance model of a material thickness on a titanium surface was conducted, to further evaluate the reflectance information gathered with diffractive optical element-based sensor.
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